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dc.contributor.authorTong, Zhaomin
dc.contributor.authorShen, Wenjiang
dc.contributor.authorSong, Shaohua
dc.contributor.authorCheng, Wenzhi
dc.contributor.authorCai, Zhuo
dc.contributor.authorMa, Yifei
dc.contributor.authorWei, Lei
dc.contributor.authorMa, Weiguang
dc.contributor.authorXiao, Liantuan
dc.contributor.authorJia, Suotang
dc.contributor.authorChen, Xuyuan
dc.date.accessioned2020-02-17T13:24:31Z
dc.date.available2020-02-17T13:24:31Z
dc.date.created2017-07-11T09:58:04Z
dc.date.issued2017
dc.identifier.citationOptics Express. 2017, 25 (4), 3795-3804.
dc.identifier.issn1094-4087
dc.identifier.urihttps://hdl.handle.net/11250/2642026
dc.description.abstractIn high lumen laser projectors, it is required to use laser diodes coupled to multi-mode fibers (MMFs) to obtain a high power illumination module. In this paper, we have fabricated an electromagnetic micro-scanning mirror (EM-MSM), and we have firstly demonstrated a speckle reduction method by the combination of the EM-MSM and the MMF. With the help of a condenser lens, laser beams modulated and reflected from the EM-MSM are coupled into the MMF within its acceptance angle. Because the fast scanning behavior of the EM-MSM results in the phase modulation and mode coupling among the MMF guided modes, the light intensity field distributions at the exit aperture of the MMF are changing. During the charge-coupled device (CCD) integration time, the random speckle patterns are integrated and homogenized by the CCD camera, and hence speckle is reduced. By driving the EM-MSM in raster scan, the lowest compound speckle contrast ratio at 0.0794 is obtained, where the EM-MSM half scanning angles are 0.4 ° and the optical power loss is lower than 4.5%. The demonstrated technique is compact and can endure the high power of the laser module; thus, it has a promising potential in high lumen laser projector applications.
dc.language.isoeng
dc.titleCombination of micro-scanning mirrors and multi-mode fibers for speckle reduction in high lumen laser projector applications
dc.typePeer reviewed
dc.typeJournal article
dc.description.versionpublishedVersion
dc.source.pagenumber3795-3804
dc.source.volume25
dc.source.journalOptics Express
dc.source.issue4
dc.identifier.doi10.1364/OE.25.003795
dc.identifier.cristin1481839
cristin.unitcode222,58,4,0
cristin.unitnameInstitutt for mikrosystemer
cristin.ispublishedtrue
cristin.fulltextoriginal
cristin.qualitycode1


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