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dc.contributor.authorAasmundtveit, Knut
dc.contributor.authorLuu, Thi Thuy
dc.contributor.authorNguyen, Hoang-Vu
dc.contributor.authorLarsson, Andreas
dc.contributor.authorTollefsen, Torleif Andre
dc.date.accessioned2019-02-18T09:28:34Z
dc.date.available2019-02-18T09:28:34Z
dc.date.created2019-02-15T09:07:30Z
dc.date.issued2018
dc.identifier.isbn978-1-78923-179-3
dc.identifier.urihttp://hdl.handle.net/11250/2585852
dc.descriptionThis chapter is distributed under the terms of the Creative which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited Commons Attribution Licens.nb_NO
dc.description.abstractSolid-liquid interdiffusion (SLID) bonding for microelectronics and microsystems is a bonding technique relying on intermetallics. The high-melting temperature of intermetallics allows for system operation at far higher temperatures than what solder-bonded systems can do, while still using similar process temperatures as in common solder processes. Additional benefits of SLID bonding are possibilities of fine-pitch bonding, as well as thin-layer metallurgical bonding. Our group has worked on a number of SLID metal systems. We have optimized wafer-level Cu-Sn SLID bonding to become an industrially feasible process, and we have verified the reliability of Au-Sn SLID bonding in a thermally mismatched system, as well as determined the actual phases present in an Au-Sn SLID bond. We have demonstrated SLID bonding for very high temperatures (Ni-Sn, having intermetallics with melting points up to 1280°C), as well as SLID with low process temperatures (Au-In, processed at 180°C, and Au-In-Bi, processed at 90–115°C). We have verified experimentally the high-temperature stability for our systems, with quantified strength at temperatures up to 300°C for three of the systems: Cu-Sn, Au-Sn and Au-In.nb_NO
dc.language.isoengnb_NO
dc.relation.ispartofIntermetallic compounds : formation and applications
dc.rightsNavngivelse 4.0 Internasjonal*
dc.rights.urihttp://creativecommons.org/licenses/by/4.0/deed.no*
dc.titleIntermetallic Bonding for High-Temperature Microelectronics and Microsystems: Solid-Liquid Interdiffusion Bondingnb_NO
dc.typeChapternb_NO
dc.description.versionpublishedVersionnb_NO
dc.rights.holder© 2018 The Author(s).nb_NO
dc.source.pagenumber43-72nb_NO
dc.identifier.doi10.5772/intechopen.75139
dc.identifier.cristin1677520
cristin.unitcode222,58,4,0
cristin.unitnameInstitutt for mikrosystemer
cristin.ispublishedtrue
cristin.fulltextoriginal
cristin.qualitycode1


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