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dc.contributor.authorTa, Bao Quoc
dc.contributor.authorHaugen, Tormod Bjørnetun
dc.contributor.authorHoivik, Nils
dc.contributor.authorHalvorsen, Einar
dc.contributor.authorAasmundtveit, Knut
dc.date.accessioned2017-12-19T14:09:38Z
dc.date.available2017-12-19T14:09:38Z
dc.date.created2013-10-24T14:46:12Z
dc.date.issued2013
dc.identifier.citationMaterials. 2013, 6 (8), 3160-3170.nb_NO
dc.identifier.issn1996-1944
dc.identifier.urihttp://hdl.handle.net/11250/2473024
dc.description.abstractLocal synthesis and direct integration of carbon nanotubes (CNTs) into microsystems is a promising method for producing CNT-based devices in a single step, low-cost, and wafer-level, CMOS/MEMS-compatible process. In this report, the structure of the locally grown CNTs are studied by transmission imaging in scanning electron microscopy—S(T)EM. The characterization is performed directly on the microsystem, without any post-synthesis processing required. The results show an effect of temperature on the structure of CNTs: high temperature favors thin and regular structures, whereas low temperature favors “bamboo-like” structures.nb_NO
dc.language.isoengnb_NO
dc.relation.urihttp://www.mdpi.com/1996-1944/6/8/3160
dc.rightsNavngivelse 3.0 Internasjonal*
dc.rights.urihttp://creativecommons.org/licenses/by/4.0/deed.no*
dc.titleLocal Synthesis of Carbon Nanotubes in Silicon Microsystems: The Effect of Temperature Distribution on Growth Structurenb_NO
dc.typeJournal articlenb_NO
dc.typePeer reviewednb_NO
dc.description.versionpublishedVersionnb_NO
dc.rights.holder© 2013 by the authors; licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution license (http://creativecommons.org/licenses/by/3.0/).nb_NO
dc.source.pagenumber3160-3170nb_NO
dc.source.volume6nb_NO
dc.source.journalMaterialsnb_NO
dc.source.issue8nb_NO
dc.identifier.doi10.3390/ma6083160
dc.identifier.cristin1060048
dc.relation.projectNorges forskningsråd: 190086nb_NO
cristin.unitcode222,58,4,0
cristin.unitnameInstitutt for mikrosystemer
cristin.ispublishedtrue
cristin.fulltextoriginal
cristin.qualitycode1


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