Browsing Institutt for mikrosystemer by Journals "Journal of Electronic Materials"
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Characterization of the Electrical Properties of a Double Heterostructure GaN/AlGaN Epitaxial Layer with an AlGaN Interlayer
(Peer reviewed; Journal article, 2021)This paper proposes a double-heterostructure (DH) GaN/AlGaN epitaxial layer that contains an AlGaN interlayer. The electrical properties are characterized and compared with conventional single-heterostructure (SH) GaN/AlGaN ...