Browsing USN Open Archive by Journals "2011 IEEE 57th Holm Conference on Electrical Contacts (Holm)"

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    • High current arc erosion on copper electrodes in air 

      Øyvang, Thomas; Fjeld, Elin; Rondeel, Wilhelm; Hagen, Svein Thore (Journal article; Peer reviewed, 2011)
      An arc fault inside metal enclosed switchgear will cause the pressure to rise and vaporization of electrode material may contribute to the pressure rise. An experimental study of high current arc erosion on copper electrodes ...