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dc.contributor.authorBolstad, Per Kristian
dc.contributor.authorKuziora, Stephane
dc.contributor.authorNguyen, Hoang-Vu
dc.contributor.authorManh, Tung
dc.contributor.authorAasmundtveit, Knut
dc.contributor.authorHoff, Lars
dc.date.accessioned2022-08-05T07:34:00Z
dc.date.available2022-08-05T07:34:00Z
dc.date.created2020-11-23T14:36:40Z
dc.date.issued2020
dc.identifier.citationBolstad, P. K., Kuziora, S. L., Nguyen, H. V., Manh, T., Aasmundtveit, K. E., & Hoff, L. (2020, September 15-18). Impact of High Pressures on Au-Sn Solid Liquid Interdiffusion (SLID) Bonds [Conference presentation]. 2020 IEEE 8th Electronics System-Integration Technology Conference (ESTC). Tønsberg.en_US
dc.identifier.isbn978-1-7281-6293-5
dc.identifier.urihttps://hdl.handle.net/11250/3010240
dc.description.abstractThis paper investigates the influence of high pressure on Au-Sn solid-liquid interdiffusion (SLID) bonds formed by bonding Si substrates to dies of either lead-zirconate titanate (PZT) with high surface roughness or Si with low surface roughness. Bonded samples were exposed to 1000 bar pressure in a silicone oil filled pressure vessel. Samples were characterized before and after exposure by means of scanning acoustic microscopy, optical microscopy and scanning electron microscopy with energy dispersive x-ray spectroscopy. All but one sample successfully passed the pressure exposure. This failed sample had a delamination in the proximity of a large void in the intermetallic layer.en_US
dc.language.isoengen_US
dc.relation.ispartof2020 IEEE 8th Electronics System-Integration Technology Conference (ESTC)
dc.titleImpact of High Pressures on Au-Sn Solid Liquid Interdiffusion (SLID) Bondsen_US
dc.typeChapteren_US
dc.description.versionacceptedVersionen_US
dc.rights.holder© 2020 IEEE.en_US
dc.identifier.doihttps://doi.org/10.1109/ESTC48849.2020.9229855
dc.identifier.cristin1851122
dc.relation.projectNorges forskningsråd: 237887en_US
dc.relation.projectNorges forskningsråd: 245963en_US
cristin.ispublishedtrue
cristin.fulltextpostprint
cristin.qualitycode1


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