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dc.contributor.authorHaugen, Tormod Bjørnetun
dc.contributor.authorTa, Bao Quoc
dc.contributor.authorHalvorsen, Einar
dc.contributor.authorHoivik, Nils
dc.contributor.authorAasmundtveit, Knut
dc.date.accessioned2017-12-19T14:04:16Z
dc.date.available2017-12-19T14:04:16Z
dc.date.created2013-10-24T14:35:04Z
dc.date.issued2013
dc.identifier.citationMaterials. 2013, 6 (8), 3094-3107nb_NO
dc.identifier.issn1996-1944
dc.identifier.urihttp://hdl.handle.net/11250/2473018
dc.description.abstractCarbon nanotubes (CNTs) have been directly grown onto a silicon microsystem by a local synthesis method. This method has potential for wafer-level complimentary metal-oxide-semiconductor (CMOS) transistor-compatible integration of CNTs into more complex Si microsystems; enabling, e.g., gas sensors at low cost. In this work, we demonstrate that the characteristics of CNTs grown on specific locations can be changed by tuning the synthesis conditions. We also investigate the role of the contact between CNTs and the Si microsystem; observing a large influence on the electrical characteristics of our devices. Different contact modes can render either an ohmic or Schottky-like rectifying characteristics.nb_NO
dc.language.isoengnb_NO
dc.relation.urihttp://www.mdpi.com/1996-1944/6/8/3094
dc.rightsNavngivelse 3.0 Internasjonal*
dc.rights.urihttp://creativecommons.org/licenses/by/4.0/deed.no*
dc.titleIntegration of Carbon Nanotubes in Microsystems: Local Growth and Electrical Properties of Contactsnb_NO
dc.typeJournal articlenb_NO
dc.typePeer reviewednb_NO
dc.description.versionpublishedVersionnb_NO
dc.rights.holder© 2013 by the authors; licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution license (http://creativecommons.org/licenses/by/3.0/).nb_NO
dc.source.pagenumber3094-3107nb_NO
dc.source.volume6nb_NO
dc.source.journalMaterialsnb_NO
dc.source.issue8nb_NO
dc.identifier.doi10.3390/ma6083094
dc.identifier.cristin1060038
dc.relation.projectNorges forskningsråd: 190086nb_NO
cristin.unitcode222,58,4,0
cristin.unitnameInstitutt for mikrosystemer
cristin.ispublishedtrue
cristin.fulltextoriginal
cristin.qualitycode1


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