dc.contributor.author | Mirmotahari, Omid | |
dc.contributor.author | Berg, Yngvar | |
dc.date.accessioned | 2016-06-10T13:15:30Z | |
dc.date.accessioned | 2016-10-21T09:01:32Z | |
dc.date.available | 2016-06-10T13:15:30Z | |
dc.date.available | 2016-10-21T09:01:32Z | |
dc.date.issued | 2015 | |
dc.identifier.citation | Circuits and Systems 2015, 6(5):121-135 | nb_NO |
dc.identifier.issn | 2153-1293 | |
dc.identifier.uri | http://hdl.handle.net/11250/2416833 | |
dc.description.abstract | In this paper, we present a solution to the ultra low voltage inverter by adding a keeper transistor in order to make the semi-floating-gate more stable and to reduce the current dissipation. Moreover, we also present a differential ULV inverter and elaborate on the reliability and fault tolerance of the gate. The differential ULV gate compared to both a former ULV gate and standard CMOS are given. The results are obtained through Monte-Carlo simulations. | nb_NO |
dc.language.iso | eng | nb_NO |
dc.rights | Navngivelse 3.0 Norge | * |
dc.rights.uri | http://creativecommons.org/licenses/by/3.0/no/ | * |
dc.title | Reliability of High Speed Ultra Low Voltage Differential CMOS Logic | nb_NO |
dc.type | Journal article | nb_NO |
dc.type | Peer reviewed | |
dc.date.updated | 2016-06-10T13:15:30Z | |
dc.identifier.doi | 10.4236/cs.2015.65013 | |
dc.identifier.cristin | 1244200 | |