Vis enkel innførsel

dc.contributor.authorGholamimayani, Mahdieh
dc.contributor.authorTekseth, Kim Robert Bjørk
dc.contributor.authorBreiby, Dag Werner
dc.contributor.authorKlein, Joern
dc.contributor.authorAkram, Muhammad Nadeem
dc.date.accessioned2023-02-16T07:41:43Z
dc.date.available2023-02-16T07:41:43Z
dc.date.created2022-11-04T12:56:58Z
dc.date.issued2022
dc.identifier.citationGholami Mayani, M., Tekseth, K. R., Breiby, D. W., Klein, J. & Akram, M. N. (2022). High-resolution polarization-sensitive Fourier ptychography microscopy using a high numerical aperture dome illuminator. Optics Express, 30(22), 39891-39903.en_US
dc.identifier.issn1094-4087
dc.identifier.urihttps://hdl.handle.net/11250/3051274
dc.description.abstractPolarization-sensitive Fourier-ptychography microscopy (pFPM) allows for high resolution imaging while maintaining a large field of view, and without mechanical movements of optical-setup components. In contrast to ordinary light microscopes, pFPM provides quantitative absorption and phase information, for complex and birefringent specimens, with high resolution across a wide field of view. Using a semi-spherical home-built LED illumination array, a single polarizer, and a 10x /0.28NA objective, we experimentally demonstrate high performance pFPM with a synthesized NA of 1.1. Applying the standard quantitative method, a measured half-pitch resolution of 244 nm is achieved for the 1951 USAF resolution test target. As application examples, the polarimetric properties of a herbaceous flowering plant and the metastatic carcinoma of human liver cells are analyzed and quantitatively imaged.en_US
dc.language.isoengen_US
dc.publisherOptica Publishing Groupen_US
dc.titleHigh-resolution polarization-sensitive Fourier ptychography microscopy using a high numerical aperture dome illuminatoren_US
dc.typeJournal articleen_US
dc.typePeer revieweden_US
dc.description.versionpublishedVersionen_US
dc.rights.holder© 2022 Optica Publishing Group under the terms of the Optica Open Access Publishing Agreement.en_US
dc.source.pagenumber39891-39903en_US
dc.source.volume30en_US
dc.source.journalOptics Expressen_US
dc.source.issue22en_US
dc.identifier.doihttps://doi.org/10.1364/OE.469115
dc.identifier.cristin2069196
dc.relation.projectNorges forskningsråd: 272248en_US
dc.relation.projectNorges forskningsråd: 275182en_US
cristin.ispublishedtrue
cristin.fulltextoriginal
cristin.qualitycode2


Tilhørende fil(er)

Thumbnail

Denne innførselen finnes i følgende samling(er)

Vis enkel innførsel